Scanning Electron Microscope (SEM)
SEM-MMT X-Factor 150 Scanning Electron Microscope
The Scanning Electron Microscope allows for qualatative, quantitative, and thickness analysis of materials.
The high-resolution imaging produced by the MMT X-Factor 150 Scanning Electron Microscope provides sample observation with a greater focus on a sample’s depth and structure in comparison to standard optical microscopes.
If you are interested in a test method that is not shown, please contact us and we will do our best to accommodate your testing needs.
Phone: 330.577.4088 / Email: ACE_sales@aceprodcon.com