Scanning Electron Microscope (SEM)

SEM-MMT X-Factor 150 Scanning Electron Microscope

Summary

The Scanning Electron Microscope allows for qualatative, quantitative, and thickness analysis of materials.

Test Details

The high-resolution imaging produced by the MMT X-Factor 150 Scanning Electron Microscope provides sample observation with a greater focus on a sample’s depth and structure in comparison to standard optical microscopes.

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